Title of article
New memory-type control charts for monitoring process mean and dispersion
Author/Authors
Riaz Muhammad نويسنده , Ajadi Jimoh Olawale نويسنده City University of Hong Kong
Pages
16
From page
3423
To page
3438
Abstract
Control chart is widely used to monitor the quality of products of industrial or
business processes. Max-CUSUM and Max-EWMA are based on memory-type control
charts that monitor the process mean and standard deviation simultaneously. This
article introduces four new control charts that monitor the process mean and dispersion
simultaneously. The proposed control charting schemes are compared with the existing
counterparts including Max-EWMA, Max-CUSUM, SS-EWMA, and SS-CUSUM. A case
study is presented for practical considerations using a real dataset
Journal title
Astroparticle Physics
Serial Year
2017
Record number
2412065
Link To Document