Title of article :
New memory-type control charts for monitoring process mean and dispersion
Author/Authors :
Riaz Muhammad نويسنده , Ajadi Jimoh Olawale نويسنده City University of Hong Kong
Pages :
16
From page :
3423
To page :
3438
Abstract :
Control chart is widely used to monitor the quality of products of industrial or business processes. Max-CUSUM and Max-EWMA are based on memory-type control charts that monitor the process mean and standard deviation simultaneously. This article introduces four new control charts that monitor the process mean and dispersion simultaneously. The proposed control charting schemes are compared with the existing counterparts including Max-EWMA, Max-CUSUM, SS-EWMA, and SS-CUSUM. A case study is presented for practical considerations using a real dataset
Journal title :
Astroparticle Physics
Serial Year :
2017
Record number :
2412065
Link To Document :
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