Author/Authors :
Roostaie, Neda Department of physics, Alzahra University, Tehran, Iran , Sheykhi, Elham Department of physics, Alzahra University, Tehran, Iran , Japelaghi, Fariba Department of physics, Alzahra University, Tehran, Iran , Bassam, Mohammad Amin Department of physics, Malek-Ashtar University of Technology, Tehran, Iran , Tavaddod, Sharareh Department of physics, University of Edinburgh, Scotland , Sajad, Batool Department of physics, Alzahra University, Tehran, Iran
Abstract :
Total internal reflection fluorescence microscopy (TIRFM) is an optical
technique that allows imaging of a thin layer of the sample with a thickness of about
100-200 nm. It is used in science of cell biology to study cellular processes, especially
near the membranes of living cells. This method is based on the total internal reflection
phenomenon, where the evanescent wave is generated in the less dense medium. In fact,
the evanescent wave is used to illuminate the sample. Consequently, the possibility of
observing a superficial (instead of bulk) part of fluorophore labeled sample is opened
up. In this work, a total internal reflection fluorescence microscope based on the light
guide has been designed and assembled by means of the inverted microscope to image a
thin layer from the surface of the sample. Operated experimental arrangement has been
employed for the total internal reflection fluorescence imaging of cadmium selenide
(CdSe) quantum dots.
Keywords :
Evanescent wave , fluorescence , microscopy , total internal reflection
