Future MISFET gate dielectric: NiO/PVA Nanohybride composites

This paper reports on the electrical and nanostructural properties of polymer-based materials in corporation with NiO (Nickel oxide) in weight concentrations of 0.2%, 0.4%, and 0.8% of PVA (polyvinyl alcohol) polymer. Nanocrystallite phases and properties were characterized by using X-ray diffraction (XRD), Fourier transfer infrared (FTIR) radiation, scanning electron microscopy (SEM), and atomic force microscopy (AFM) techniques. The dielectric constant of the samples has been calculated through measuring the capacity of the samples by application of GPS 132 A. Electrical property characterization was also performed with cyclic-voltameter (C-V) technique in TRIS solution; pH = 7.3, with the formula (HOCH2)3CNH2.