Title of article
Studying Some Electrical Properties for ZnSe Films Prepared by Using the Thermal Evaporation Method in vacuum
Author/Authors
Taha, R.Y. University of Al- Mustansiriya - College of Science - Department of Physical, Iraq , Raouf, A. M. University of Al- Mustansiriya - College of Science - Department of Physical, Iraq
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Abstract
Thin films of zinc selenide ZnSe have been prepared by using thermal evaporation method in vacuum with different thickness (1000 – 4000) Ao and a deposited on glass substrate and studying some electrical properties including the determination of A.C conductivity and real, imaginary parts of dielectric constant and tangent of loss angle. The result shows that increasing value of A.C conductivity with increasing thickness and temperature, and increasing capacitance value with increasing the temperature and decrease with increasing frequency . Real and imaginary parts of dielectric constant and tangent of loss angle decrease with increasing frequency
Keywords
Semiconductors , thin films , Znse , electrical properties
Journal title
Ibn Alhaitham Journal For Pure and Applied Science
Journal title
Ibn Alhaitham Journal For Pure and Applied Science
Record number
2601894
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