Author/Authors :
Wang, Z. P. University of Toyama - Faculty of Engineering,Electric power system Laboratory - Department of Electric and Electronic Systems, Japan. , Nakada, Y. University of Toyama - Faculty of Engineeringm,Electric power system Laboratory - Department of Electric and Electronic Systems, Japan. , Ito, H. University of Toyama - Faculty of Engineering,Electric power system Laboratory - Department of Electric and Electronic Systems, Japan. , Masugata, K. University of Toyama - Faculty of Engineering,Electric power system Laboratory - Department ofElectric and Electronic Systems, Japan.
Abstract :
Oiamond-like carbon films were prepared by electron ablation of graphite target insert anode in a 20kJ dense plasmafocus. Silicon (100) substrates are placed in different axial position. Raman spectra of OLC films are characterized by two broad peaks centered around 13.50cm^-1 and 1580cm^-1 known as O-band and G-band respectively. The peak intensityratio and peak position have been discussed for the investigation of the OLC films. The intensity ratio of the 0 band toG band (lD/IG) is increased for the films by increasing the axial position. The Correlation between Raman shift for Gband position and Intensity ratio of the 0 band to G band were investigated by hardness measurements.
