Title of article
Study the Effect of Thermal Treatment and Variation of CdS Thickness on Structural Properties of CdS/CdTe Heterojunction
Author/Authors
Al-Hamdani, Kadhim A.A. University of Baghdad - College of Science, Iraq , Mohamed, Ghuson H. University of Baghdad - College of Science, Iraq , Al-Mizban, Enas S.Y. University of Anbar - College of Medicine, Iraq
From page
54
To page
59
Abstract
A polycrystalline CdS/CdTe heterojunction prepared by thermal evaporation technique atsubstrate temperature of 373 K and heat treatment for annealing temperature 573 K for different duration times of annealing (ta) 60 and 120 min. under vacuum of (10-5) mbar and different thicknesses of CdS layer of about 1000Å, 1500Å and 2000Å. The X-ray diffraction (XRD) technique shows polycrystalline structure and had a mixture of cubic and hexagonal structure.The recrystallization of films enhanced thermally represented by increasing the grain size. The CdS/CdTe heterojunction with the higher thickness of CdS layer shows better crystal structure.
Keywords
Thermal Treatment , Variation , CdS , Structural Properties , CdS , CdTe , Heterojunction
Journal title
Journal Of University Of Anbar For Pure Science
Journal title
Journal Of University Of Anbar For Pure Science
Record number
2663148
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