Title of article :
Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes
Author/Authors :
Tanay Karnik، نويسنده , , IEEE Peter Hazucha، نويسنده , , IEEE Jagdish Patel ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
16
From page :
128
To page :
143
Keywords :
High Performance , error tolerance , Reliability , soft error , single event upset
Journal title :
I E E E Transactions on Dependable and Secure Computing
Serial Year :
2004
Journal title :
I E E E Transactions on Dependable and Secure Computing
Record number :
289436
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=289436
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