Title of article :
A Low-Cost Concurrent BIST Scheme for Increased Dependability
Author/Authors :
Ioannis Voyiatzis
Constantin Halatsis
، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Keywords :
input vector monitoring concurrent BIST. , concurrent testing , Built-in self test
Journal title :
I E E E Transactions on Dependable and Secure Computing
Journal title :
I E E E Transactions on Dependable and Secure Computing
