Title of article
Critical Analysis of the PIE Testability Technique
Author/Authors
Zuhoor Al-Khanjari، نويسنده , , Martin Woodward and Haider Ali Ramadhan ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
24
From page
331
To page
354
Keywords
testability , PIE technique , mutant schemata , infection , sensitivity
Journal title
Software Quality Journal
Serial Year
2002
Journal title
Software Quality Journal
Record number
292794
Link To Document