مرکز منطقه ای اطلاع رساني علوم و فناوري - Critical Analysis of the PIE Testability Technique

Title of article :

Critical Analysis of the PIE Testability Technique

Author/Authors :

Zuhoor Al-Khanjari، نويسنده , , Martin Woodward and Haider Ali Ramadhan ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

331

To page :

354

Keywords :

testability , PIE technique , mutant schemata , infection , sensitivity

Journal title :

Software Quality Journal

Serial Year :

2002

Journal title :

Software Quality Journal

Record number :

292794

Link To Document :