Ultra-Trace Element Analysis of NIST SRM 616 and 614 using Laser Ablation Microprobe-Inductively Coupled Plasma-Mass Spectrometry (LAM-ICP-MS): a Comparison with Secondary Ion Mass Spectrometry (SIMS)
Author/Authors :
Ingo Horn، نويسنده , , Richard W. Hinton، نويسنده , , Simon E. Jackson، نويسنده , , Henry P. Longerich، نويسنده ,
