Title of article :
Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS
Author/Authors :
A. Boulton، نويسنده , , D. Fornasiero، نويسنده , , J. Ralston، نويسنده ,
Pages :
15
From page :
205
To page :
219
Keywords :
Pyrite , selective flotation , X-ray photoelectron spectroscopy , sphalerite , Time of Flight Secondary IonMass Spectroscopy
Journal title :
Astroparticle Physics
Record number :
315725
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=315725
