مرکز منطقه ای اطلاع رساني علوم و فناوري - Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis

Title of article :

Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation

Author/Authors :

K. O. Kjellsen، نويسنده , , A. Mons?y، نويسنده , , K. Isachsen، نويسنده , , R. J. Detwiler، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2003

Pages :

From page :

611

To page :

616

Keywords :

Backscattered electron imaging , SEM , EDX , Microstructure , Specimen preparation

Journal title :

CEMENT AND CONCRETE RESEARCH

Serial Year :

2003

Journal title :

CEMENT AND CONCRETE RESEARCH

Record number :

317009

Link To Document :