Title of article :
In-process roughness measurement on moving surfaces
Author/Authors :
Wong، P. L. نويسنده , , Li، K. Y. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
-542
From page :
543
To page :
0
Abstract :
A new optical technique, which utilises the combined effects of interference and light scattering, was developed for surface roughness measurements. This paper presents the technique applicable to extracting the roughness of moving surfaces under high rotational speeds up to 3.7 m/s. The applicability of the technique to in-process roughness measurement was demonstrated with a cylindrical grinding process.
Keywords :
Relative gap , Evanescent switching , Frustrated total internal reflection
Journal title :
OPTICS & LASER TECHNOLOGY
Serial Year :
1999
Journal title :
OPTICS & LASER TECHNOLOGY
Record number :
31877
Link To Document :
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