Title of article :
Laser diode interferometer used for measuring displacements in large range with a nanometer accuracy
Author/Authors :
Qian، Feng نويسنده , , Wang، Xuefeng نويسنده , , Wang، Xiangzhao نويسنده , , Lu، Hongbin نويسنده , , Bu، Yang نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
In this paper, the displacement of an object is measured with a photothermal phasemodulating laser diode interferometer. A feedback control system is designed to reduce the measurement errors caused by the fluctuations in the optical wavelength of the laser diode and the vibrations of the optical components in the interferometer. A new method is proposed to enlarge the measuring range of displacement. Using this method, the measuring range is enlarged from half wavelength to nearly 125 mu m and the measurement accuracy is about 1 nm. The simulation and experimental results have shown the usefulness of the method and the feedback control system.
Keywords :
Slit-scanning method , M2 factor measurement
Journal title :
OPTICS & LASER TECHNOLOGY
Journal title :
OPTICS & LASER TECHNOLOGY