Title of article :
Cost-effective infrared thermography protocol for 40 μm spatial resolution quantitative microelectronic imaging
Author/Authors :
Christine Boue، نويسنده , , Daniele Fournier، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Keywords :
Microelectronics reliability , imaging , temperature measurement , Infrared thermography
Journal title :
Infrared Physics & Technology
Journal title :
Infrared Physics & Technology