مرکز منطقه ای اطلاع رساني علوم و فناوري - Measurement of the double layer capacitance of aluminium samples by holographic interferometry

Title of article :

Measurement of the double layer capacitance of aluminium samples by holographic interferometry

Author/Authors :

K. Habib، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1996

Pages :

From page :

579

To page :

584

Keywords :

oxidation reaction , Holographic interferometry , electrochemical impedance spectroscopy , Anodization , double layercapacitance , HeNe laser light

Journal title :

OPTICS & LASER TECHNOLOGY

Serial Year :

1996

Journal title :

OPTICS & LASER TECHNOLOGY

Record number :

334549

Link To Document :