Title of article
Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry
Author/Authors
P. Adamson، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
8
From page
561
To page
568
Keywords
Optical diagnostics , Nanoscale %lms , Di(erential re)ectivity , Ellipsometry
Journal title
OPTICS & LASER TECHNOLOGY
Serial Year
2002
Journal title
OPTICS & LASER TECHNOLOGY
Record number
334866
Link To Document