Title of article :
Limit analysis for laser removal of micron contaminant colloidal silicon dioxide particles from the super-smooth optical glass substrate by pulse Nd:YAG laser
Author/Authors :
Meng-Hua Ye، نويسنده , , Xingkuan Shi، نويسنده , , Edmund Cheung and Weizheng Yuan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
12
From page :
9
To page :
20
Keywords :
Super-smooth substrate surface , Laser Cleaning , Nd:YAG laser , Micro-particle contamination
Journal title :
OPTICS & LASER TECHNOLOGY
Serial Year :
2005
Journal title :
OPTICS & LASER TECHNOLOGY
Record number :
335119
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=335119
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