Title of article
Self-marking phase-stepping electronic speckle pattern interferometry (ESPI) for determining a phase map with least residues
Author/Authors
M.J. Huang and Bo-Son Yun، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
13
From page
136
To page
148
Keywords
Residue , Phase unwrapping , ESPI , Phase shifting
Journal title
OPTICS & LASER TECHNOLOGY
Serial Year
2007
Journal title
OPTICS & LASER TECHNOLOGY
Record number
335336
Link To Document