مرکز منطقه ای اطلاع رساني علوم و فناوري - Self-marking phase-stepping electronic speckle pattern interferometry (ESPI) for determining a phase map with least residues

Title of article :

Self-marking phase-stepping electronic speckle pattern interferometry (ESPI) for determining a phase map with least residues

Author/Authors :

M.J. Huang and Bo-Son Yun، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2007

Pages :

From page :

136

To page :

148

Keywords :

Residue , Phase unwrapping , ESPI , Phase shifting

Journal title :

OPTICS & LASER TECHNOLOGY

Serial Year :

2007

Journal title :

OPTICS & LASER TECHNOLOGY

Record number :

335336

Link To Document :