Title of article
Reliability Analysis and Modeling of Power MOSFETs in the 42-V-PowerNet .
Author/Authors
A. Castellazzi، نويسنده , , Y. C. Gerstenmaier، نويسنده , , R. Kraus، نويسنده , , and G. K. M. Wachutka، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
10
From page
603
To page
612
Keywords
Electrothermal effects , powermetal-oxide semiconductor field-effect transistors (MOSFETs) , modeling , Reliability.
Journal title
IEEE TRANSACTIONS ON POWER ELECTRONICS
Serial Year
2006
Journal title
IEEE TRANSACTIONS ON POWER ELECTRONICS
Record number
340833
Link To Document