Measurement-Based Method to Characterize Parasitic Parameters of the Integrated Power Electronics Modules

L. Yang and W. G. H. Odendaal، نويسنده ,

روزنامه با شماره پیاپی سال 2007

9

54

62

characterization , common-mode (CM) , differentialmode (DM) , Electromagnetic interference (EMI) , integrated power electronicsmodules (IPEMs) , Measurement , noise , packaging , parasitic inductors. , parasiticcapacitance , electromagnetic compatibility (EMC)

IEEE TRANSACTIONS ON POWER ELECTRONICS

2007

IEEE TRANSACTIONS ON POWER ELECTRONICS

340980