Author/Authors :
Marcus B?umer، نويسنده , , Hans-Joachim Freund، نويسنده ,
Keywords :
(Deposited) metal particles , (Ordered) oxide®lms , Scanning tunneling microscopy , Spot pro®le analysis LEED , TRANSMISSION ELECTRON MICROSCOPY , Photoelectron spectroscopy , Structure , Metal deposition , Infrared spectroscopy , Elec , (Deposited) metal clusters