• Title of article

    Simulation of drop/impact reliability for electronic devices

  • Author/Authors

    Y.Y. Wang، نويسنده , , C. Lu، نويسنده , , J. Li، نويسنده , , X.M. Tan، نويسنده , , Y.C. Tse، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    14
  • From page
    667
  • To page
    680
  • Keywords
    Finite element method , Drop test , Packaging material , Reliability , modeling and simulation , Virtual productdevelopment , Virtual test
  • Journal title
    FINITE ELEMENTS IN ANALYSIS & DESIGN
  • Serial Year
    2004
  • Journal title
    FINITE ELEMENTS IN ANALYSIS & DESIGN
  • Record number

    351562

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=351562