Title of article
Finite element modeling of dislocation reduction in GaAs and InP single crystals grown from the VGF process
Author/Authors
X.A. Zhu، نويسنده , , Gary Sheu، نويسنده , , C.T. Tsai، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
12
From page
81
To page
92
Keywords
VGF growth process , GaAs and InP crystals , Doping impurity , Dislocation density
Journal title
FINITE ELEMENTS IN ANALYSIS & DESIGN
Serial Year
2006
Journal title
FINITE ELEMENTS IN ANALYSIS & DESIGN
Record number
351707
Link To Document