Title of article
Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds
Author/Authors
Paul E. W. Labossiere، نويسنده , , Martin L. Dunn ، نويسنده , , Shawn J. Cunningham، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
29
From page
405
To page
433
Keywords
Crack initiation , A. Stress intensity factor , failure mechanism , Interface corner
Journal title
Journal of the Mechanics and Physics of Solids
Serial Year
2002
Journal title
Journal of the Mechanics and Physics of Solids
Record number
354489
Link To Document