مرکز منطقه ای اطلاع رساني علوم و فناوري - Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry

Title of article :

Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry

Author/Authors :

T. -S. Park، نويسنده , , S. Suresh، نويسنده , , A. J. Rosakis، نويسنده , , J. Ryu، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2003

Pages :

From page :

2191

To page :

2211

Keywords :

Full-%eld curvature map , large deformation , Twistcurvature , Bifurcation , Coherent gradient sensing

Journal title :

Journal of the Mechanics and Physics of Solids

Serial Year :

2003

Journal title :

Journal of the Mechanics and Physics of Solids

Record number :

354667

Link To Document :