Title of article :
Yield stress strengthening in ultrafine-grained metals: A two-dimensional simulation of dislocation dynamics
Author/Authors :
S. Lefebvre، نويسنده , , B. Devincre ، نويسنده , , T. Hoc، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Keywords :
Plastic deformation , Dislocation dynamics , Size effects , Semiconductor material , simulation
Journal title :
Journal of the Mechanics and Physics of Solids
Journal title :
Journal of the Mechanics and Physics of Solids
