Title of article :
High resolution electron microscopy of zeolites
Author/Authors :
M. Pan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
20
From page :
219
To page :
238
Keywords :
low-dose , SSZ-26 , slow-scan CCD camera , SSZ-33 , radiation damage , offretite , digital diffractogram , erionite , quantitative image analysis , tschernichite , real-space averaging , intergrowth , online image acquisition , stackingfaults , online image evaluation , 2D 3-connected net. , structural determination , Zeolites , ZSM-5 , Beta , FAU , EMT , HREM , ABC-6 , projected potential maps , sodalite
Journal title :
Micron
Serial Year :
1996
Journal title :
Micron
Record number :
356644
Link To Document :
بازگشت