Title of article
Observation of point defect production and clustering by high voltage electron microscopy: Interaction of point defect with solutes
Author/Authors
Heishichiro Takahashi، نويسنده , , Yasuyoshi Hidaka ، نويسنده , , S. Ohnuki، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
8
From page
239
To page
246
Keywords
void , electron irradiation , stacking fault tetrahedra , defect cluster. , high voltage electron microscope , Vacancy , interstitial , helium atom
Journal title
Micron
Serial Year
1996
Journal title
Micron
Record number
356645
Link To Document