Observation of point defect production and clustering by high voltage electron microscopy: Interaction of point defect with solutes

Heishichiro Takahashi، نويسنده , , Yasuyoshi Hidaka ، نويسنده , , S. Ohnuki، نويسنده ,

روزنامه با شماره پیاپی سال 1996

8

239

246

void , electron irradiation , stacking fault tetrahedra , defect cluster. , high voltage electron microscope , Vacancy , interstitial , helium atom

Micron

1996

Micron

356645