Title of article :
Applications of FT-IR microscopy with materials analyses
Author/Authors :
Peter Wilhelm، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
4
From page :
341
To page :
344
Keywords :
FT IR microscopy , attenuated total reflectance , rubber. , materials analyses , infrared spectroscopy , Polymers
Journal title :
Micron
Serial Year :
1996
Journal title :
Micron
Record number :
356652
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356652
