Title of article :
A New Method for the Measurement of Thickness in Single Crystals
Author/Authors :
Janos L. Labar ، نويسنده , , Jerzy Morgiel، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
6
From page :
425
To page :
430
Keywords :
ALCHEMI , thickness measurement , convergent beam electron diffraction (CBED) , Pattern recognition , single crystal
Journal title :
Micron
Serial Year :
1998
Journal title :
Micron
Record number :
356752
Link To Document :
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