Topography and lattice strain development on patterned Si surfaces

J. M. Blakely ، نويسنده , , C. C. Umbach، نويسنده ,

روزنامه با شماره پیاپی سال 1999

10

3

12

Si surfaces , Tunneling microscopy , Optical and electron diffraction , evaporation , Atomic steps , diffusion , Step-free surfaces , Lattice strain , Stepdynamics , Atomic force microscopy

Micron

1999

Micron

356759