• Title of article

    Scanning tunneling microscopy studies during semiconductor growth

  • Author/Authors

    Bert Voigtl، نويسنده , , er، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    7
  • From page
    33
  • To page
    39
  • Keywords
    thin films , Semicon , Silicon , Scanning tunneling microscopy (STM) , Molecular beam epitaxy (MBE) , germanium
  • Journal title
    Micron
  • Serial Year
    1999
  • Journal title
    Micron
  • Record number

    356762

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356762