Cross-sectional scanning tunneling microscopy of mixed-anion semiconductor heterostructures

Edward T. Yu، نويسنده ,

روزنامه با شماره پیاپی سال 1999

8

51

58

Nanometer , atomic , Cross-sectional , Semiconductor , Heterostructure , atomic , Cross-sectional , NanometerScanning tunneling microscopy , III–V , III–V , Semiconductor , Heterojunction , Heterostructure , Heterojunction , Scanning tunneling microscopy

Micron

1999

Micron

356764