Author/Authors :
Nobuo Tanaka and Keiichi Namba، نويسنده , , Norihito Takeuchi، نويسنده ,
Keywords :
Scanning tunneling microscopy (STM) , Si(111) surface , Scanning tunneling spectra (STS) , Deposition-apparatus , Reflectionhigh-energy electron diffraction (RHEED) , DV-Xa method , Tungsten clusters