Title of article :
Applications of focused ion beam microscopy to materials science specimens
Author/Authors :
M. W. Phaneuf، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
12
From page :
277
To page :
288
Keywords :
Focused ion beam , Liquid-metal ion sources , FIB
Journal title :
Micron
Serial Year :
1999
Journal title :
Micron
Record number :
356789
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356789
