Maximum-entropy deconvolution applied to electron energy-loss spectroscopy

M. H. F. Overwijk ، نويسنده , , D. Reefman، نويسنده ,

روزنامه با شماره پیاپی سال 2000

7

325

331

Signal-to-noise ratio , Electron energy-loss spectra , Maximum-entropy deconvolution , Carbon K-edge , TRANSMISSION ELECTRON MICROSCOPY , Super resolution , Resolutionimprovement , deconvolution

Micron

2000

Micron

356850