Title of article :
Nanoscale EELS analysis of dielectric function and bandgap properties in GaN and related materials
Author/Authors :
G. Brockt ، نويسنده , , H. Lakner، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
435
To page :
440
Keywords :
Electron Energy Loss Spectroscopy , Scanning transmission electron microscope , Reflectivity , GaN , ALN , Dielectric function
Journal title :
Micron
Serial Year :
2000
Journal title :
Micron
Record number :
356860
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356860
