Title of article :
A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces
Author/Authors :
K. T. Moore، نويسنده , , E. A. Stach، نويسنده , , J. M. Howe، نويسنده , , D. C. Elbert ، نويسنده , , D. R. Veblen ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Keywords :
Energy-®ltered transmission electron microscopy (EFTEM) , signal-to-noise ratio (SNR) , electron energy-loss spectroscopy (EELS) , Energy-®ltered image (EFI) , Elemental map , Jump-ratio image , Semiconductor interfaces
