Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

Tamotsu Ohno، نويسنده , , Masaya Sengoku ، نويسنده , , Tatsuo Arii، نويسنده ,

روزنامه با شماره پیاپی سال 2002

4

403

406

high voltage electron microscope , Electron diffraction , Image plate , Behenic acid monolayer , Electron beam damage , Critical dose , detective quantum efficiency , radiation damage , Organic crystal

Micron

2002

Micron

357015