Title of article
Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates
Author/Authors
Tamotsu Ohno، نويسنده , , Masaya Sengoku ، نويسنده , , Tatsuo Arii، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
403
To page
406
Keywords
high voltage electron microscope , Electron diffraction , Image plate , Behenic acid monolayer , Electron beam damage , Critical dose , detective quantum efficiency , radiation damage , Organic crystal
Journal title
Micron
Serial Year
2002
Journal title
Micron
Record number
357015
Link To Document