Title of article :
Redeposition effects in transmission electron microscope specimens of FeAl–WC composites prepared using a focused ion beam
Author/Authors :
J. M. Cairney ، نويسنده , , P. R. Munroe ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Keywords :
transmission electron microscope , Redeposition artifact , Focused ion beam , Specimen preparation
