Comparison of different sample preparation techniques in TEM observation of microstructure of INCONEL alloy 783 subjected to prolonged isothermal exposure
Author/Authors :
Longzhou Ma، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
7
From page :
273
To page :
279
Keywords :
Ion milling , Jet electro-polishing , Alloy 783 , Focused ion beam (FIB
