Title of article
The application of FIB milling for specimen preparation from crystalline germanium
Author/Authors
A. S. Rubanov، نويسنده , , P. R. Munroe ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
8
From page
549
To page
556
Keywords
Focused ion beam , sample preparation , sample preparation , damage , TRANSMISSION ELECTRON MICROSCOPY , germanium
Journal title
Micron
Serial Year
2004
Journal title
Micron
Record number
357190
Link To Document