Title of article
EBSD FEG-SEM, TEM and XRD techniques applied to grain study of a commercially pure 1200 aluminum subjected to equal-channel angular-pressing
Author/Authors
M. Cabibbo، نويسنده , , E. Evangelista ، نويسنده , , C. Scalabroni، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
14
From page
401
To page
414
Keywords
X-ray diffraction , FEG-SEM , SPD , EBSD , microstructure , TEM
Journal title
Micron
Serial Year
2005
Journal title
Micron
Record number
357252
Link To Document