Title of article :
EBSD FEG-SEM, TEM and XRD techniques applied to grain study of a commercially pure 1200 aluminum subjected to equal-channel angular-pressing
Author/Authors :
M. Cabibbo، نويسنده , , E. Evangelista ، نويسنده , , C. Scalabroni، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
14
From page :
401
To page :
414
Keywords :
X-ray diffraction , FEG-SEM , SPD , EBSD , microstructure , TEM
Journal title :
Micron
Serial Year :
2005
Journal title :
Micron
Record number :
357252
Link To Document :
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