Title of article :
Atomic force microscopy and the mechanism of fatigue crack growth
Author/Authors :
M. Jono، نويسنده , , A. Sugeta ، نويسنده , , Y. Uematsu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Keywords :
Crack branching , imageprocessing technique , Fatigue crack growth , microscopic observation , Mode I , slip deformation , 3% siliconiron. , Atomic Force Microscope
Journal title :
Fatigue and Fracture of Engineering Materials and Structures
Journal title :
Fatigue and Fracture of Engineering Materials and Structures
