Title of article :
A ball-indentation method to evaluate the critical stress for dislocation generation in a silicon substrate
Author/Authors :
H. Ohta، نويسنده , , S. Kida and H. Miura، نويسنده , , M. Kitano، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Keywords :
etch-pit , Ion implantation , semiconductor device , silicon. , Dislocation
Journal title :
Fatigue and Fracture of Engineering Materials and Structures
Journal title :
Fatigue and Fracture of Engineering Materials and Structures