Title of article :
An Analog Self-Test Based on Differential IDD Monitoring Supported by Differential IOUT Checking
Author/Authors :
M. Sidiropulos، نويسنده , , V. Stopjakov?، نويسنده , , H. Manhaeve and V. Musil ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
12
From page :
33
To page :
44
Keywords :
analog circuits - analog self-test - dynamic I DD monitoring - VLSI - CMOS - ASIC
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
1999
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
366995
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=366995
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