Title of article :
Design and Analysis of Built-In Testers for CMOS Switched-Current Circuits
Author/Authors :
Cheng-Ping Wang and Chin-Long Wey، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
10
From page :
179
To page :
188
Keywords :
cyclic A/D converters , Switched-Current technique , built-in testers , mixed-signal circuits , voltagewindow comparator , current comparator
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
2000
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
367020
Link To Document :
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