Title of article :
Parametric Yield Optimization of MOS ICʹs Affected by Device Mismatch
Author/Authors :
Massimo Conti، نويسنده , , Paolo Crippa، نويسنده , , Simone Orcioni and Claudio Turchetti ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
19
From page :
181
To page :
199
Keywords :
device mismatch , parametric yield , optimization , statistical variations
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
2001
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
367170
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367170
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