مرکز منطقه ای اطلاع رساني علوم و فناوري - High-Level Fault Modeling in Surface-Micromachined MEMS

Title of article :

High-Level Fault Modeling in Surface-Micromachined MEMS

Author/Authors :

N. Deb and R. D. (Shawn) Blanton ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

151

To page :

158

Keywords :

FEA , MEMS , NODAS

Journal title :

Analog Integrated Circuits and Signal Processing

Serial Year :

2001

Journal title :

Analog Integrated Circuits and Signal Processing

Record number :

367187

Link To Document :